（电视信号的）测试图案

test pattern───（电视信号的）测试图案

stress patterns───应力图；应力型；应力分布图；应力分布型式

tread patterns───[橡胶]胎面花纹

test papers───考试试卷；[分化]试纸

stress pattern───应力图；应力型；应力分布图；应力分布型式

flow patterns───流型

repatterns───我们回去吧

test paper───[分化]试纸；测验试卷；供检定笔迹的文件

to pattern───到模式

Congratulations! You have successfully created a local broker ready to test patterns.───祝贺您！您已经成功创建了一个可用于测试模式的本地代理。

test suite is made up of test cases, based on one of two available test patterns: operation-level testing or scenario based testing.───测试套件由测试用例构成，并基于以下两种可用的测试模式之一：操作级别的测试或基于场景的测试。

Because this method doesn't use memory to store the test patterns, it can save certain area of the chip.───该方法由于没有采用存储器存储测试模板，所以可以节省一定的芯片面积。

In this stage test patterns are fed into every single chip and the response from the chip monitored and compared to "the right answer. "───将测试向量输入到每一个芯片，对其输出结果进行记录并和“正确答案”比较。

A new testability measure is presented to guide test generation such that test patterns with fewer care bits are obtained.───一个新的测度被提出以获得具有较少的确定位数量的确定性测试向量。

The test suite is made up of test cases, based on one of two available test patterns: operation-level testing or scenario based testing.───测试套件由测试用例构成，并基于以下两种可用的测试模式之一：操作级别的测试或基于场景的测试。

Recently, a BIST scheme using test patterns applied by Circuit-under-Test (TPAC) is proposed.───由被测电路自己施加测试向量的内建自测试方法是最近新提出的一种自测试技术。

Different test patterns should be used according to different stages of students' oral English levels.───对于学生不同的语言阶段应采取不同的考核手段。

Path delay fault testing can detect lots of defects that can not be detected by the test patterns targeting stuck-at faults.───路径延迟故障测试能够检测到针对固定型故障的测试向量所无法检测到的缺陷。

It is shown that any feedback bridging faults between primary inputs and the primary output in any general combinational networks can be betected by using only two test patterns.

This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.

Sequence circuit test patterns always have redundancy.

The proposed method can generate simplified test patterns with high fault coverage, and can detect multiple faults as many as possible.

Path delay fault testing can detect lots of defects that can not be detected by the test patterns targeting stuck-at faults.

The experiment indicates that the scheme has prominent advantages compared with the hybrid code and the method which is LFSR reseeding based on syncopation of some test patterns.

I've set up the subject player using the THX optimizer test patterns for contrast and grey scale.